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Power Semiconductor Accelerated Aging Testing Platform

Product Introduction

This testing platform is mainly used to accelerate the aging speed of power semiconductor devices, which can shorten their 10-30 year operating life to less than 3 months. During the aging process, real-time and comprehensive monitoring of the electrical and thermal performance is carried out to deeply evaluate the reliability and lifespan of the tested power semiconductor.

產(chǎn)品功能
發(fā)現(xiàn)出廠缺陷
批量產(chǎn)品出廠時(shí)部分器件存在難
以避免的缺陷
電熱性能評(píng)估
檢測(cè)是否滿足特定應(yīng)用場(chǎng)景
電熱運(yùn)行的設(shè)計(jì)要求
壽命周期預(yù)測(cè)
提前預(yù)測(cè)功率模塊在不同工況下
的運(yùn)行壽命周期
產(chǎn)品特點(diǎn)
· 可拆卸可配置的功率循環(huán)模塊，自由DIY
· 可配置4個(gè)1000A的模組
· 可同時(shí)對(duì)最多16個(gè)模塊進(jìn)行測(cè)試
· 電源最大輸出電流/電壓為4000A/10V
折扇式的三面蓋門(mén)，
方便操作，空間占據(jù)小
· 可實(shí)現(xiàn)功率器件內(nèi)部老化部位的分離監(jiān)測(cè)
· 操作簡(jiǎn)單，測(cè)試過(guò)程可實(shí)現(xiàn)數(shù)字化可觀可控
具有結(jié)構(gòu)函數(shù)分析能力，
獲取熱阻信息
產(chǎn)品規(guī)格表
產(chǎn)品型號(hào)